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Dan Tian
Public Documents
1
Fractal pull-in instability for a micro-electromechanical device with a current-carry...
Dan Tian
and 2 more
July 31, 2020
Pull-in effect always occurs in a micro-electromechanical system, and its pull-in analysis is essential for the normal operation. This paper aims at studying the environment effect on the pull-in instability, especially the nano/micro particles in air. A fractal model is established using a fractal derivative, and the pull-in instability can be converted into a novel state of pull-in stability when the fractal dimension tends to be very small.