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\begin{document}

\title{Nondestructive high-throughput screening of wheat spike and grain}



\author[1]{Eva Hufnagel}%
\author[1]{Mareike Weule}%
\author[1]{Joelle Claussen}%
\author[1]{Stefan Gerth}%
\affil[1]{Affiliation not available}%


\vspace{-1em}



  
  \date{June 10, 2024}


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\selectlanguage{english}
\begin{abstract}
Given the changing environmental conditions, understanding internal
mechanisms of crops and their interaction with the environment in
abiotic stress conditions is very important. To estimate the yield of
e.g. wheat, spike and grain traits are used for the selection of
resilient genotypes for further breeding programs. Typically, the
extraction of these traits is laborious and destructive. With automated
X-ray technology a non-destructive screening of spikes can be conducted
faster and more accurate. Furthermore, the technology allows extracting
additional traits such as center of mass and aspect ratio of each grain,
together with the position of the grain within the spike.

We present the analysis of 203 wheat accessions carried out using a
portable computed-tomography system (CT). The wheat plants were exposed
to either drought or combined drought and heat stress. With the EarS
algorithm, spike traits were analyzed with an accuracy of 95-99\%. The
system scanned 4 spikes simultaneously, which resulted in a
scanning-time of 7 minutes per spike. To enable a high-throughput
acquisition and comparison of wheat traits, we present the required
steps for automation. Thus, together with PhenoKey, we developed an
automated CT-system with integrated conveyor belt for The Plant
Accelerator\selectlanguage{ngerman}®, University of Adelaide. This system examines spikes and
grains with high throughput. The system has space for 35 spike holders,
each of which can carry 30 spikes. This allows a scanning time of 13
seconds per spike. Combined with an automatic data post processing each
grain can be identified and linked to the corresponding genotype.%
\end{abstract}\selectlanguage{ngerman}%



\sloppy


\emph{\textbf{Eva Hufnagel\textsuperscript{1}}, Mareike
Weule\textsuperscript{1}, Joelle Claussen\textsuperscript{1}, Stefan
Gerth\textsuperscript{1}}

\selectlanguage{ngerman}\emph{\textsuperscript{1 Fraunhofer Institute for Integrated Circuits
IIS, Development Centre X-Ray Technology, Fürth, Germany}}

\textbf{ORCiD:} 0009-0003-0546-0276

\textbf{Keywords:} X-ray, High-throughput, Phenotyping, Yield, Seed
morphology, Genetic diversity

\selectlanguage{english}
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